Australian Government: National Measurement Institute
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National Measurement Institute
      
Nanometrology Capabilities 
We are developing physical standards, instruments and methods for nanoscale measurements with an initial focus on dimensional metrology at the nanometre length scale. Our main application areas are:
  • transfer standards for the calibration of ultra-high resolution microscopes
  • characterisation of nanomaterials, specifically nanoparticles

We currently offer the following measurement services:

  • dimensional measurements of nanostructures using atomic force microscopy
  • measurement of particle size distributions for particles in liquid suspensions in the size range:
    • 1 nm to 1 µm using dynamic light scattering
    • 100 nm to 1 mm using laser diffraction
  • measurement of the zeta potential of particles using laser Doppler anemometry

Through collaboration with national research infrastructure networks and local universities we have access to state-of-the-art electron microscopy facilities for the characterisation of nanostructures.

 

In the near future we will extend our measurement capabilities to include:

  • size classification of particle size distributions for particles in liquid suspensions in the size range:
    • 5 nm to 75 µm using disk centrifugation
    • 1 nm to 10 µm using field flow fractionation
  • measurement of surface area and porosity of powders using gas sorption analysis

For further information contact nano@measurement.gov.au.

 

International Certification Campaign for SiO2 Nanoparticles

We have successfully tendered for providing nanoparticle measurement services to the European Commission's Institute for Reference Materials and Measurements (IRMM) in Geel, Belgium, as part of IRMM's international certification campaign for SiO2 nanoparticle reference material. This follows NMI having demonstrated proficiency in a 2009 feasibility study and subsequently being awarded 'qualified supplier' status for measurements of particle size using dynamic light scattering and transmission electron microscopy and for measurements of zeta potential using electrophoretic light scattering.